US Patent Issued to KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE on April 21 for "Real-time three-dimensional shape measurement system and shape measurement method using diagonal line pattern irradiation method" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,459, issued on April 21, was assigned to KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE (Daejeon, South Korea).

"Real-time three-dimensional shape measurement system and shape measurement method using diagonal line pattern irradiation method" was invented by Young-Sik Ghim (Sejong, South Korea), The Manh Nguyen (Daejeon, South Korea) and Hyug-Gyo Rhee (Deajeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to relates to a system and method for measuring a real-time three dimensional shape using a diagonal fringe pattern. Particularly, in the deflectometry applied to real-time three dimensional shape mea...