US Patent Issued to KOKUSAI DENKI Electric on Feb. 24 for "Abnormality detection device, abnormality detection method, and abnormality detection system" (Japanese Inventor)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,783, issued on Feb. 24, was assigned to KOKUSAI DENKI Electric Inc. (Tokyo).

"Abnormality detection device, abnormality detection method, and abnormality detection system" was invented by Keigo Hasegawa (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A technique is provided for detecting the presence or absence of an abnormality with respect to an object appearing in a target image with high accuracy without using AI, even in an environment in which luminance values and colors are likely to fluctuate. An abnormality detection device (230) includes: an image input unit (232) for inputting an input image indicating an abnormality detection targe...