US Patent Issued to KLA on Aug. 11 for "System and method for defect detection using deep learning-based image segmentation" (Indian, American Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,724, issued on Aug. 11, was assigned to KLA Corp. (Milpitas, Calif.).

"System and method for defect detection using deep learning-based image segmentation" was invented by Arjun Hegde (Fremont, Calif.), Surajit Mondal (Chennai, India), Balla Guna Sai Sandeep (Chennai, India) and Chandrashekaran Gurumurthy (Chennai, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system may be configured to receive training images of features on the sample. The system may be configured to generate a segmentation model based on the training images. The system may be configured to receive product images of product features and identify, using the segmentation mo...