US Patent Issued to Kioxia on Sept. 29 for "Semiconductor system and wiring defect detecting method" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,549, issued on Sept. 29, was assigned to Kioxia Corp. (Tokyo).

"Semiconductor system and wiring defect detecting method" was invented by Kouichirou Inoue (Yokosuka Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor system includes a first semiconductor chip, a second semiconductor chip stacked above the first semiconductor chip, a controller configured to control the first and second semiconductor chips, a first wiring connected between the controller and each of the first and second semiconductor chips and by which a first signal is to be transmitted from the controller to each of the first and second semiconductor chip...