US Patent Issued to KIOXIA on Dec. 16 for "Feature based read threshold estimation in NAND flash memory" (Israeli Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,951, issued on Dec. 16, was assigned to KIOXIA Corp. (Tokyo).

"Feature based read threshold estimation in NAND flash memory" was invented by Eyal Nitzan (Haifa, Israel), Avi Steiner (Haifa, Israel) and Hanan Weingarten (Haifa, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for reading data from a solid-state drive (SSD) configured to store data in a plurality of memory cells arranged in memory blocks comprising rows, the method performed by a controller in communication with the plurality of memory cells. The method comprises retrieving data from a target row of memory cells of the plurality of memory cells associated with a read req...