US Patent Issued to KEYSIGHT TECHNOLOGIES on March 31 for "Rectenna array for detecting power radiated pattern of microwave or millimeter-wave signals" (Chinese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,039, issued on March 31, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).

"Rectenna array for detecting power radiated pattern of microwave or millimeter-wave signals" was invented by Zhu Wen (Beijing), Xiong Bin Liao (Beijing), Li Cao (Beijing), Zi Quan Bai (Beijing) and Sheng Qi Zhang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system is provided for measuring a power radiated pattern of an incident radio frequency (RF) signal indicating spatial distribution characteristics of a device under test (DUT). The system includes multiple antenna elements arranged in an array, where the antenna elements include antennas and...