US Patent Issued to KEYSIGHT TECHNOLOGIES on Jan. 27 for "Methods of removing intrinsic noise from signal under test (SUT)" (California Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,515, issued on Jan. 27, was assigned to KEYSIGHT TECHNOLOGIES INC. (Santa Rosa, Calif.).

"Methods of removing intrinsic noise from signal under test (SUT)" was invented by Marlin E. Viss (Santa Rosa, Calif.) and David Leyba (Santa Rosa, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test system implemented method removes intrinsic noise from a waveform representation of a repeating signal under test (SUT). The method includes obtaining an oversampled equivalent-time waveform representation of the repeating SUT. The method further includes obtaining a time-domain representation of a combined noise of the equivalent-time waveform above the de...