US Patent Issued to KEYENCE on May 19 for "Probe for three-dimensional scanner and three-dimensional scanner" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,443, issued on May 19, was assigned to KEYENCE Corp. (Osaka, Japan).

"Probe for three-dimensional scanner and three-dimensional scanner" was invented by Yuji Miyaki (Osaka, Japan) and Masayasu Ikebuchi (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Favorable measurement workability is obtained by further enhancing a degree of freedom in handling a probe while enhancing measurement accuracy. A probe for a three-dimensional scanner includes a first marker block and a second marker block that are arrayed side by side in a first direction with a scanner unit positioned at a center, and a third marker block and a fourth marker block that are...