US Patent Issued to KEYENCE on Dec. 23 for "Shape inspection device, processing device, height image processing device" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,277, issued on Dec. 23, was assigned to KEYENCE Corp. (Osaka, Japan).

"Shape inspection device, processing device, height image processing device" was invented by Kaoru Kanayama (Osaka, Japan) and Takashi Atoro (Osaka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a shape inspection device, a processing device, a height image processing method, and a height image processing program capable of accurately inspecting a measurement object. A profile data generation unit sequentially generates a plurality of pieces of profile data as the measurement object relatively moves in a Y-axis direction. A height image generation unit extracts...