ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,726, issued on Aug. 11, was assigned to KEYENCE Corp. (Osaka, Japan).
"Appearance inspection apparatus and appearance inspection method" was invented by Kyosuke Tawara (Osaka, Japan) and Yasuhisa Ikushima (Osaka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "It is possible to quickly present an alternative model without causing deterioration in usability of a user. Learning data is input to a machine learning network to train the machine learning network, and a first inference model configured to perform quality determination of input images is generated. The input images sequentially input to the first inference model and quality determinati...