US Patent Issued to Keithley Instruments on Sept. 29 for "Low current leakage measurement on a high current unified static and dynamic characterization platform" (Ohio Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,145, issued on Sept. 29, was assigned to Keithley Instruments LLC (Solon, Ohio).

"Low current leakage measurement on a high current unified static and dynamic characterization platform" was invented by Gregory Sobolewski (Brecksville, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing system includes a Device Under Test (DUT) interface structured to couple to one or more DUTs and a device characterization circuit structured to be controlled to perform static testing and dynamic testing of the one or more DUTs. The device characterization circuit includes a drain amplifier coupled to a drain of the one or more DUTs that is structured to m...