US Patent Issued to Keithley Instruments on March 17 for "Unified measurement system for static and dynamic characterization of a device under test" (Ohio Inventor)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,379, issued on March 17, was assigned to Keithley Instruments LLC (Solon, Ohio).

"Unified measurement system for static and dynamic characterization of a device under test" was invented by Gregory Sobolewski (Brecksville, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement system includes a device under test (DUT) interface structured to couple to first and second DUTs that are coupled to form a half bridge circuit. A characterization circuit is controlled to perform static testing and dynamic testing of the first and second DUTs. The characterization circuit includes a solid-state bias tee including the first DUT and a first...