US Patent Issued to KEIO UNIVERSITY on March 31 for "Infrared analysis chip, and infrared imaging device" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,888, issued on March 31, was assigned to KEIO UNIVERSITY (Tokyo).

"Infrared analysis chip, and infrared imaging device" was invented by Hideyuki Maki (Kanagawa, Japan) and Yusuke Fukazawa (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A configuration of a time and space-resolved infrared spectroscopic analysis which can be integrated onto a chip is provided. An infrared analysis chip includes a substrate in which a microchannel is formed, at least one of a spectroscope and a photodetector integrated onto a first surface of the substrate in an area where the microchannel is formed, and an infrared light source integrated on a second...