ALEXANDRIA, Va., July 14 -- United States Patent no. 12,678,780, issued on July 14, was assigned to Kawasaki Jukogyo K.K. (Kobe, Japan).

"Testing system" was invented by Yasuhiko Hashimoto (Kobe, Japan), Yukio Iwasaki (Kobe, Japan), Atsushi Kameyama (Kakogawa, Japan), Toshihiko Miyazaki (Kobe, Japan), Shogo Kubota (Kobe, Japan), Satoshi Ouchi (Kobe, Japan), Eiji Mitsui (Kobe, Japan), Tatsuya Shirai (Kakamigahara, Japan), Hiroshi Mitsui (Kakamigahara, Japan) and Tomoya Nakanishi (Kakamigahara, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing system collects a specimen from a subject and measures the collected specimen to test the specimen, and includes a first unit to collect and receive the spe...