US Patent Issued to JPMORGAN CHASE BANK on Feb. 17 for "Systems and methods for prediction of test failures" (British, American Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,618, issued on Feb. 17, was assigned to JPMORGAN CHASE BANK N.A. (New York).

"Systems and methods for prediction of test failures" was invented by Georgios Papadopoulos (London), Fanny Silavong (London), Sean Moran (London) and Alla Nadein (Englewood Cliffs, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Method for prediction of test failures are disclosed. A method may include retrieving, by a test failure prediction computer program, test results for a test; training, by the test failure prediction computer program, a machine learning engine based on one or more hypotheses; receiving, by the test failure prediction computer program, metrics f...