ALEXANDRIA, Va., Jan. 28 -- United States Patent no. D1,110,279, issued on Jan. 27, was assigned to Johnstech International Corp. (Minneapolis).
"Contact pin for integrated circuit testing" was invented by Melissa Hasskamp (Minneapolis).
The patent was filed on May 7, 2024, under Application No. D/941,010.
*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1110279&OS=D1110279&RS=D1110279
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