US Patent Issued to JIANGSU ACADEMY OF AGRICULTURAL SCIENCES on April 14 for "Multiple KASP marker primer set for wheat plant height major genes and use thereof" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,014, issued on April 14, was assigned to JIANGSU ACADEMY OF AGRICULTURAL SCIENCES (Jiangsu, China).

"Multiple KASP marker primer set for wheat plant height major genes and use thereof" was invented by Peng Jiang (Jiangsu, China), Xu Zhang (Jiangsu, China), Lei Wu (Jiangsu, China), Yi He (Jiangsu, China) and Chang Li (Jiangsu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multiplex KASP marker primer set for a set of wheat plant height major genes, consisting of a pre-primer having a nucleotide sequence as shown in SEQ ID NO. 10, a post-primer having a nucleotide sequence as shown in SEQ ID NO. 11, and a universal primer having a nucleotide...