ALEXANDRIA, Va., July 21 -- United States Patent no. 12,688,611, issued on July 21, was assigned to JEOL Ltd. (Tokyo).
"Electron microscope and calibration method" was invented by Yuji Konyuba (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electron microscope includes an electron optical system that irradiates a sample with an electron beam to form an image with electrons transmitted through the sample, a camera that includes an image sensor having sensor pixels and captures frame images that are based on output values output from each of the sensor pixels by incidence of the electrons on the image sensor, and a correction coefficient calculation unit that calculates correction coefficients for cor...