US Patent Issued to JEOL on Feb. 17 for "Mass spectrometry apparatus and mass spectrometry method for adjusting ion accumulation times based on detection intensity" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,762, issued on Feb. 17, was assigned to JEOL Ltd. (Tokyo).

"Mass spectrometry apparatus and mass spectrometry method for adjusting ion accumulation times based on detection intensity" was invented by Shinichi Mukousaka (Tokyo), Junkei Kou (Tokyo) and Kiyotaka Konuma (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Ions ejected from a collision cell are detected by a detector. An evaluation unit generates a temporary calibration curve based on an intensity of a detection signal and evaluates an ion accumulation time of the collision cell based on the temporary calibration curve. When the evaluation unit determines signal saturation, the ion accu...