ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,110, issued on May 12, was assigned to JENTEK Sensors Inc. (Marlborough, Mass.).
"Complex part inspection with eddy current sensors" was invented by Neil J Goldfine (Cocoa Beach, Fla.), Mark Windoloski (Chelmsford, Mass.) and Todd M Dunford (Amherst, Mass.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Eddy current sensing is governed by the diffusion equation of magnetoquasistatic fields. As such the eddy current sensor's proximity to the object to be inspected (i.e., "liftoff") significantly affects the sensor's response signal. Methods and apparatus are disclosed for improving performance for an eddy current sensor, though they may also be used fo...