ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,165, issued on May 12, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Hyogo, Japan).
"Probe card" was invented by Chikaomi Mori (Hyogo, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "[Problem] The objective is to provide a probe card that are less prone to contact failure, with good high-frequency characteristics, current endurance, and good conductivity. [Solution] A probe card includes a wiring board 10 formed with one or more probe electrodes 102, an upper guide plate 13 spaced below the wiring board 10 and facing the wiring board 10, formed with one or more upper guide holes 131, a lower guide plate 14 spaced below the upper guide plate ...