US Patent Issued to JABIL on April 21 for "Optical back reflection diagnostics for micro optical components" (Florida Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,540, issued on April 21, was assigned to JABIL INC..

"Optical back reflection diagnostics for micro optical components" was invented by Guan Weihua (St. Petersburg, Fla.), William Sterling (St. Petersburg, Fla.) and Chao Su (St. Petersburg, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus, system and method for testing a micro-optical component system. The apparatus, system and method may include a receiver for receiving the micro optical component system; a light source; and a coupler for passing aspects of light from the light source through the micro optical component system to a termination, and for passing remaining aspects fro...