ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,688, issued on Sept. 15, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).
"X-ray inspection apparatus" was invented by Futoshi Yurugi (Ritto, Japan), Yoshiaki Sakagami (Ritto, Japan), Atsushi Yamakawa (Ritto, Japan) and Kota Tominaga (Ritto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection apparatus includes: a conveyance unit; an X-ray irradiation unit that irradiates an article conveyed by the conveyance unit with an X-ray; an X-ray detection unit that detects the X-ray that has transmitted through the article; an inspection unit that generates an X-ray transmission image from the X-ray detected by the X-ray detection unit ...