ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,853, issued on Aug. 25, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).
"X-ray inspection apparatus" was invented by Futoshi Yurugi (Ritto, Japan), Kota Tominaga (Ritto, Japan), Shojiro Kita (Ritto, Japan) and Satoshi Onda (Ritto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection apparatus includes a conveying unit configured to convey an article, an irradiation unit configured to irradiate the article conveyed by the conveying unit with X-rays, a sensor unit in which detecting elements are arranged in a planar shape, an image generation unit configured to read detection results output from at least some of the detecting eleme...