US Patent Issued to IPGOAL MICROELECTRONICS (SICHUAN) on Sept. 9 for "Segmented capacitance calibration circuit applied in pure capacitor array structure" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,413,239, issued on Sept. 9, was assigned to IPGOAL MICROELECTRONICS (SICHUAN) Co. LTD. (Chengdu, China).

"Segmented capacitance calibration circuit applied in pure capacitor array structure" was invented by Lun Wang (Sichuan, China) and Xiangyang Guo (Sichuan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A segmented capacitance calibration circuit applied in a pure capacitor array structure includes a first calibration unit, a second calibration unit and a selection switch which are all connected with a scaling capacitor. The first and second calibration units include at least one capacitor, and the selection switch is configured to select the ...