US Patent Issued to ION BEAM APPLICATIONS on March 17 for "Method for updating risk analysis parameters of a technical system" (Belgian Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,015, issued on March 17, was assigned to ION BEAM APPLICATIONS SA (Louvain-la-neuve, Belgium).

"Method for updating risk analysis parameters of a technical system" was invented by David Menichelli (Louvain-la-Neuve, Belgium), Andreas Lammerzahl (Louvain-la-Neuve, Belgium), Christoph Bert (Louvain-la-Neuve, Belgium) and Dominik Kornek (Louvain-la-Neuve, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-based method for updating risk analysis parameters of a proactive risk analysis of a technical system, such as of an FMEA analysis for example. The method uses incident report data obtained during posterior operation of the technical s...