ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,742,797, issued on Sept. 22, was assigned to InZiv Ltd. (Jerusalem).
"System and method for automatic probe card replacement" was invented by Ori Dadoosh (Raanana, Israel), Yuri Levinzon (Tel Aviv, Israel), Doobie Abraham (Haifa, Israel), Yuval Yohai (Rehovot, Israel), Netanel Refaelovich (Eliav, Israel), Matan Saydoff (Reut, Israel), Yaakov Davidi (Nof Aylon, Israel), Baoting Huang (Tel Aviv, Israel), Andrey Ignatov (Jerusalem) and David Colin Chase (Jerusalem).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system and a method of automatically replacing a probe card used to test and inspect semiconductor devices are disclosed. The method for replacin...