US Patent Issued to Inventec (Pudong) Technology, INVENTEC on Dec. 16 for "Functional metadata system and method for data quality inspection" (Taiwanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,000, issued on Dec. 16, was assigned to Inventec (Pudong) Technology Corp. (Shanghai) and INVENTEC Corp. (Taipei, Taiwan).

"Functional metadata system and method for data quality inspection" was invented by Wei-Chao Chen (Taipei, Taiwan), Shu-Huei Yang (Taipei, Taiwan) and Yu-Lun Chang (Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a functional metadata method for data quality inspection, which includes steps as follows. Based on historical data, the functional metadata is established, where the functional metadata includes an acceptable pattern, a data distribution and a data definition; according to ...