ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,056, issued on March 17, was assigned to International Business Machines Corp. (Armonk, N.Y.).
"Test tagging based on failure analysis" was invented by Andrew C. M. Hicks (Highland, N.Y.), Deborah A. Furman (Staatsburg, N.Y.), Eitan Daniel Farchi (Haifa, Israel), James A O'Connor (Ulster Park, N.Y.) and Michael E Gildein (Wappingers Falls, N.Y.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Tagging a corpus of tests based upon failure analysis. Access tags associated with test cases known to execute without error against an original corpus of source code. Access a test set associated with the accessed tags, the test set containing test cases. Acces...