US Patent Issued to Intel on Sept. 22 for "Systems, methods and apparatus for data quality assessment and learning for automated devices" (American, Indian Inventors)

ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,060, issued on Sept. 22, was assigned to Intel Corp. (Santa Clara, Calif.).

"Systems, methods and apparatus for data quality assessment and learning for automated devices" was invented by Vinayak Honkote (Portland, Ore.), Rita Wouhaybi (Portland, Ore.), Rajesh Poornachandran (Portland, Ore.) and Anshu Mishra (Delhi, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to perform data quality assessment and learning for automated agents are disclosed. An example apparatus disclosed herein includes processor circuitry to calculate a data quality score for data gene...