ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,044, issued on Oct. 27, was assigned to Intel Corp. (Santa Clara, Calif.).
"Method and apparatus for accessing remote test data registers" was invented by Rakesh Kandula (Bangalore, India), Sankaran Menon (Austin, Texas) and Rolf Kuehnis (Portland, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Time to read the data registers in a remote Test Access Port (TAP) in a subsystem in a System-on-Chip (SoC) is reduced by reading multiple data registers in remote Test Access Ports in parallel. A Test Access Port Bridge provides access to multiple same width data registers in parallel. The same width data registers can be for the same function or differ...