US Patent Issued to Intel on March 17 for "Programmatically generated reduced fault injections for functional safety circuits" (American, Italian Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,351, issued on March 17, was assigned to Intel Corp. (Santa Clara, Calif.).

"Programmatically generated reduced fault injections for functional safety circuits" was invented by Richard Bousquet (Chandler, Ariz.), Anandh Krishnan (Fremont, Calif.), Vyasa Sai (Folsom, Calif.), Andrea Kroll (Plesanton, Calif.) and Mauro Pipponzi (Agrate Brianza, Italy).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques are disclosed for eliminating redundancy in fault simulations to improve efficiency and to reduce the time and computing power required to generate a robust fault list, which results in adequate diagnostic coverage of a particular post-silicon ele...