US Patent Issued to Intel on June 9 for "Sampling across multiple views in supersampling operation" (American, German Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,309, issued on June 9, was assigned to Intel Corp. (Santa Clara, Calif.).

"Sampling across multiple views in supersampling operation" was invented by Gabor Liktor (San Francisco), Karthik Vaidyanathan (San Francisco) and Tobias Zirr (Karlsruhe, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Sampling across multiple views in supersampling operation is described. An example of an apparatus includes one or more processing resources configured to perform a supersampling operation for image data generated for multiple views utilizing one or more neural networks, the processing resources including at least a first circuitry to process a first curre...