ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,550, issued on April 21, was assigned to INMOX GMBH (Vienna).
"Sensor device and method for characterizing metal chips" was invented by Michael Aufreiter (Freistadt, Austria) and Daniel Kagerbauer (Vienna).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a sensor device for characterizing a chip, comprising a chip analysis area, wherein the chip analysis area is a spatial region; a signal generator having at least one transmitting coil, wherein the signal generator is configured to generate an electrical exciter signal and to couple said signal into the chip analysis area as a magnetic signal by means of the transmitti...