ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,202, issued on March 3, was assigned to INGUN PRUFMITTELBAU GMBH (Constance, Germany).
"Test device for high-frequency applications" was invented by Wilhelm Schroff (Constance, Germany) and Sergiy Royak (Constance, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test probe (10) for contactlessly measuring the electromagnetic properties of a radio unit (20), in particular an antenna unit, having a hollow conductor (1) for transmitting electromagnetic waves, a filling element (2) which is disposed in the hollow conductor and made of a dielectric material, a lens element (3) which is disposed on the end face of the hollow conductor (1) and mad...