US Patent Issued to INGENTEC on July 14 for "Micro-LED wafer testing device and micro-LED wafer testing method" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,685,094, issued on July 14, was assigned to INGENTEC Corp. (Miaoli County, Taiwan).

"Micro-LED wafer testing device and micro-LED wafer testing method" was invented by Yi-Chuan Huang (Miaoli County, Taiwan), Hsiao-Lu Chen (Miaoli County, Taiwan), Ai-Sen Liu (Miaoli County, Taiwan) and Hsiang-An Feng (Miaoli County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A micro-LED wafer testing device, being applied to test a micro-LED wafer including a metal substrate and a plurality of micro-LEDs disposed at the metal substrate periodically, includes a transparent substrate, a plurality of through holes disposed at the transparent substrate periodicall...