ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,486, issued on May 26, was assigned to Infineon Technologies Americas Corp. (El Segundo, Calif.).
"System and method for isolation resistance measurement" was invented by Mark Healy (Cork, Ireland).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a processing device and a measurement circuit coupled to the processing device. The system further includes an auxiliary voltage supply. The processing device and the measurement circuit are powered by the auxiliary voltage supply. The measurement circuit is to apply a test voltage to a first resistor and measure a voltage drop over the first resistor. The processing device is to determine, ba...