ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,514, issued on Aug. 11, was assigned to INDIAN INSTITUTE OF TECHNOLOGY MADRAS (IIT MADRAS) (Tamil Nadu, India).
"Method for simulation assisted data generation and deep learning intelligence creation in non-destructive evaluation systems" was invented by Krishnan Balasubramanian (Chennai, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "Method and system for detecting one or more anomalies in an object are provided. The system receives experimental data of the object and applies a probability density function (PDF) upon one or more variables associated with the experimental data to determine corresponding one or more PDF estimates. The system fu...