US Patent Issued to IMEC VZW on March 24 for "Method for producing a substrate comprising multiple tips for scanning probe microscopy" (Belgian Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,943, issued on March 24, was assigned to IMEC VZW (Leuven, Belgium).

"Method for producing a substrate comprising multiple tips for scanning probe microscopy" was invented by Thomas Hantschel (Houtvenne, Belgium) and XiuMei Xu (Bertem, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "One embodiment of the present disclosure is related to a method for producing a substrate comprising a plurality of tips suitable to be used in scanning probe microscopy (SPM), wherein as a first step, a substrate is produced or provided comprising a plurality of nano-sized tips, preferably arranged in a regular array and spaced apart by nano-sized interspacings....