ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,532,555, issued on Jan. 20, was assigned to IMEC VZW (Leuven, Belgium).
"Method for producing a multipixel detector" was invented by Yunlong Li (Heverlee, Belgium), Deniz Sabuncuoglu Tezcan (Herent, Belgium), Pawel Malinowski (Heverlee, Belgium) and Gauri Karve (Tervuren, Belgium).
According to the abstract* released by the U.S. Patent & Trademark Office: "An example includes a method for producing a multipixel detector, the method including: providing a bottom layer including a first and a second bottom electrode, depositing an electrically insulating layer on the bottom layer, forming a first opening through the electrically insulating layer, depositing a first photon absorbing mat...