ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,579, issued on Sept. 15, was assigned to Imec vzw (Leuven, Belgium) and Katholieke Universiteit Leuven, KU LEUVEN R&D (Leuven, Belgium).

"Tamper-aware age sensor" was invented by Javier Diaz Fortuny (Heverlee, Belgium), Erik Bury (Ramillies, Belgium), Michiel Vandemaele (Leuven, Belgium), Robin Degraeve (De Pinte, Belgium) and Benjamin Kaczer (Heverlee, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "Examples include a sensor for estimating the operating age of an integrated circuit experiencing performance degradation and a related tamper detection method. The sensor is operable in a regular use mode or in a readout mode and includes a perf...