US Patent Issued to ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH on June 16 for "Magnetic multipole device, charged particle beam apparatus, and method of influencing a charged particle beam propagating along an optical axis" (German Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,658,402, issued on June 16, was assigned to ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH (Heimstetten, Germany).

"Magnetic multipole device, charged particle beam apparatus, and method of influencing a charged particle beam propagating along an optical axis" was invented by Benjamin Cook (Putzbrunn, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic multipole device for influencing a charged particle beam propagating along an optical axis is provided. The magnetic multipole device includes a first magnetic deflector for deflecting the charged particle beam in an x-direction with a plurality of first saddle coi...