US Patent Issued to Huawei Technologies'Co., 'Ltd.' on June 9 for "APD, APD fabrication method, detector, and laser radar system" (Chinese Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,652,866, issued on June 9, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China).

"APD, APD fabrication method, detector, and laser radar system" was invented by Hongming Shen (Shenzhen, China), Yanli Zhao (Wuhan, China), Yun Ding (Wuhan, China) and Dapan Li (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An avalanche photodiode (APD) includes a first electrode, a substrate layer, a buffer layer, a gain layer, a gradient layer, an absorption layer, a diffusion barrier layer, a contact layer, and a second electrode. The gain layer, the gradient layer, and the absorption layer are arranged vertically in sequence. The gain layer, t...