US Patent Issued to HORIBA on May 12 for "Radiation temperature measurement device and radiation temperature measurement method" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,005, issued on May 12, was assigned to HORIBA Ltd. (Kyoto, Japan).

"Radiation temperature measurement device and radiation temperature measurement method" was invented by Sho Fujino (Kyoto, Japan) and Koji Tominaga (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a radiation temperature measurement device that accurately measures a temperature of an object being measured, and that includes two infrared detection units that detect mutually different infrared wavelength bands, a spectral characteristics data storage unit that stores spectral characteristics data showing a transmittance and a reflectance of each of the obje...