US Patent Issued to HORIBA on March 31 for "Sample gas analysis device, sample gas analysis method, and program for sample gas analysis" (Japanese Inventor)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,890, issued on March 31, was assigned to HORIBA LTD. (Japan).

"Sample gas analysis device, sample gas analysis method, and program for sample gas analysis" was invented by Jorge Eduardo Lamas De Anda (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Presented is a sample gas analysis device that reduces a measurement error due to a coexistence influence of another measurement target component different from the measurement target component, analyzes a concentration of a plurality of measurement target components in a sample gas by performing multivariate analysis using a spectroscopic spectrum obtained by irradiating the sample gas with ...