US Patent Issued to HORIBA on Aug. 4 for "Particle image analysis apparatus, particle image analysis system, particle image analysis method, and program for particle image analysis apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,700,250, issued on Aug. 4, was assigned to HORIBA LTD. (Kyoto, Japan).

"Particle image analysis apparatus, particle image analysis system, particle image analysis method, and program for particle image analysis apparatus" was invented by Yasuhiro Tatewaki (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A particle analysis apparatus includes: an individual particle image generation unit that extracts individual particles from the original image and generates individual particle images; a particle characteristic calculation unit that calculates one or a plurality of types of particle characteristics for a particle in each of the individual par...