US Patent Issued to Honeywell International on May 12 for "Method and system for predicting KPI values, plant states and alarms in an industrial process" (Indian Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,209, issued on May 12, was assigned to Honeywell International Inc. (Charlotte, N.C.).

"Method and system for predicting KPI values, plant states and alarms in an industrial process" was invented by Anand Narayan (Dehra Dun, India), Rahul Ravi (Aluva, India), Rakshitha Prabhu (Bangalore, India), Akriti Kedia (Faizabad, India), Priyanshu Sinha (Bangalore, India) and Varshaneya V (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Predetermined Key Performance Indicators (KPIs) of an industrial process may be predicted. A plurality of tags each identify a corresponding KPI of the industrial process and historical values for the KPIs that a...