ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,608, issued on Feb. 10, was assigned to Honeywell International Inc. (Charlotte, N.C.).
"Anomaly detection in data" was invented by Ambarish Pathak (Mirzapur, India) and Amit Gautam (Dublin).
According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for anomaly detection in data are disclosed. A first plurality of data points that are connected to each other are partitioned into a first plurality of clusters and a corresponding functional form is determined. A second plurality of data points is compared with a threshold number. A data point of the second plurality of data points is identified as an anomaly based on a margin of error if the second plur...