ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,698,956, issued on Aug. 4, was assigned to Honeywell International Inc. (Charlotte, N.C.).
"Methods and systems for sensing deformation" was invented by Fan Yang (Charlotte, N.C.), Jun Wang (Charlotte, N.C.), Yu Hu (Charlotte, N.C.), Houyong Wang (Charlotte, N.C.) and Wu Chen (Charlotte, N.C.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, apparatuses and systems for a sensing deformation in a surface are disclosed herein. An example device may include a support unit including a first frame and a second frame. A first end of the first frame and a first end of the second frame are mechanically coupled to the surface. The sensing device includes a ...