ALEXANDRIA, Va., June 2 -- United States Patent no. 12,646,294, issued on June 2, was assigned to HON HAI PRECISION INDUSTRY (New Taipei City, Taiwan) and Foxconn Technology Group Co. Ltd. (Guangdong Province, China).
"Method and device for adjusting parmeters of machine learning model" was invented by Yung-Hui Li (New Taipei City, Taiwan), Shen-Hsuan Liu (New Taipei City, Taiwan), Van Nhiem Tran (New Taipei City, Taiwan) and Kai-Lin Yang (New Taipei City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A machine learning method comprises: (a) applying a contrastive learning model to a training image and an image mask to generate a foreground feature vector pair and a background feature vector pair; (b...